机译:Uncore组件中软错误的系统级影响
Department of Computer Engineering, Hongik University, Seoul, South Korea;
Department of Electrical Engineering, Stanford University, Stanford, CA, USA;
Department of Electrical Engineering, Stanford University, Stanford, CA, USA;
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA;
Department of Electrical Engineering and the Department of Computer Science, Stanford University, Stanford, CA, USA;
Integrated circuit modeling; Random access memory; Acceleration; Resilience; System-on-chip; Analytical models; Field programmable gate arrays;
机译:移相器:用于对软错误的系统级影响进行建模的分阶段方法
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机译:了解Uncore组件中的软错误
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