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Dynamic and short-circuit power of CMOS gates driving losslesstransmission lines

机译:CMOS门的动态和短路功率驱动无损传输线

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The dynamic and short-circuit power consumption of a complementary metal-oxide-semiconductor (CMOS) gate driving an inductance-capacitance (LC) transmission line as a limiting case of an RLC transmission line is investigated in this paper. Closed-form solutions for the output voltage and short-circuit power of a CMOS gate driving an LC transmission line are presented. A closed form solution for the short-circuit power is also presented. These solutions agree with circuit simulations within 11% error for a wide range of transistor widths and line impedances for a 0.25-μm CMOS technology. The ratio of the short circuit to dynamic power is shown to be less than 7% for CMOS gates driving LC transmission lines where the line is matched or underdriven. The total power consumption is expected to decrease as inductance effects becomes more significant as compared to a resistance-capacitance (RC)-dominated interconnect line
机译:本文研究了驱动电感电容(LC)传输线的互补金属氧化物半导体(CMOS)栅极作为RLC传输线的极限情况的动态和短路功耗。提出了驱动LC传输线的CMOS栅极的输出电压和短路功率的闭式解决方案。还提出了一种针对短路功率的封闭式解决方案。这些解决方案与0.25μmCMOS技术的各种晶体管宽度和线阻抗的11%误差内的电路仿真相吻合。对于驱动LC传输线的CMOS门,短路与动态功率之比小于7%,表明该传输线匹配或欠驱动。与以电阻电容(RC)为主的互连线相比,随着电感效应变得更加重要,预计总功耗将降低

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