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Analytical Probability Density Calculation for Step Pulse Response of a Single-Ended Buffer With Arbitrary Power-Supply Voltage Fluctuations

机译:任意电源电压波动的单端缓冲器阶跃脉冲响应的解析概率密度计算

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An analytical methodology to calculate the probability density functions (PDFs) for the step pulse response of a single-ended buffer with arbitrary power-supply voltage fluctuations is proposed. To validate the theory, a silicon IC with noise-aggressing buffers and a victim buffer was designed, fabricated, and assembled in a printed circuit board (PCB). The overall power distribution network (PDN) of the IC and PCB was modeled from impedance measurements. The PDFs of the step pulse response of the victim buffer with power-supply voltage fluctuations were calculated and validated by comparisons with HSPICE and experimental results. The obtained PDFs due to power-supply voltage fluctuations could be combined with the statistical link simulation methods for quick estimation of bit error rate (BER).
机译:提出了一种分析方法,用于计算具有任意电源电压波动的单端缓冲器的阶跃脉冲响应的概率密度函数(PDF)。为了验证该理论,设计,制造并组装了具有噪声激进缓冲器和受害者缓冲器的硅IC,并将其组装在印刷电路板(PCB)中。 IC和PCB的整体配电网络(PDN)通过阻抗测量建模。通过与HSPICE和实验结果的比较,计算并验证了受害缓冲器具有电源电压波动的阶跃脉冲响应的PDF。可以将由于电源电压波动而获得的PDF与统计链接仿真方法结合起来,以快速估计误码率(BER)。

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