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An Interface for Open-Drain Bidirectional Communication in Field Programmable Interconnection Networks

机译:现场可编程互连网络中的漏极开路双向通信接口

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摘要

An open-drain interface circuit and a corresponding interconnect topology is proposed to support bidirectional communication in a field programmable interconnection network (FPIN), similar to those implemented in field programmable gate arrays (FPGAs). The proposed interface can interconnect multiple nodes in a FPIN. With that interface, the interconnection network imitates the behavioral of open-drain (or open-collector) buses (e.g., those following the protocol). Thus, multiple open-drain I/Os from external integrated circuits (ICs) can be connected together through the FPIN by the proposed interface circuit. The interface that has been fabricated in a 0.13 CMOS technology takes per pin. Test results show that several instances of this interface can be interconnected through the proposed interconnect topology. The topology was implemented and tested combining six open-drain I/Os. The interconnect has propagation delays of approximately and for rising and falling edge transitions respectively, when each pin has a capacitance of 15 pF, where is the number of interconnected interfaces. These delays and the propagation delays of the FPIN limit the maximum number of interface circuits that can be interconnected for a given communication speed ( fast-mode plus with 3.4 Mbit/s).
机译:提出了漏极开路接口电路和相应的互连拓扑,以支持在现场可编程互连网络(FPIN)中的双向通信,类似于在现场可编程门阵列(FPGA)中实现的双向通信。提议的接口可以互连FPIN中的多个节点。借助该接口,互连网络模仿了漏极开路(或集电极开路)总线的行为(例如,遵循协议的总线)。因此,可以通过提出的接口电路通过FPIN将来自外部集成电路(IC)的多个漏极开路I / O连接在一起。采用0.13 CMOS技术制造的接口占用每个引脚。测试结果表明,可以通过建议的互连拓扑将此接口的多个实例互连。结合六个漏极开路I / O实施并测试了该拓扑。当每个引脚的电容为15 pF(互连接口的数量)时,互连的传播延迟分别约为,上升沿和下降沿的传播延迟。 FPIN的这些延迟和传播延迟限制了在给定的通信速度(快速模式加上3.4 Mbit / s)下可以互连的接口电路的最大数量。

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