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TEL Logic Style as a Countermeasure Against Side-Channel Attacks: Secure Cells Library in 65nm CMOS and Experimental Results

机译:TEL逻辑样式可作为对付侧通道攻击的对策:65nm CMOS中的安全单元库和实验结果

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This paper presents experimental results on a dual-rail pre-charge logic family whose power consumption is insensitive to unbalanced load conditions. The proposed logic family is based on the time enclosed logic (TEL) encoding and can be viewed as an improvement of the delay based dual rail pre-charge logic (DDPL) logic style. The DDPL logic gates have been redesigned to avoid the early evaluation effect and to reduce area and power consumption. A library of TEL secure gates and flip-flops has been implemented in a 65 nm CMOS process. The developed library allows adopting a semi-custom design flow (automatic place and route) without any constraint on the routing of the complementary wires. A four bit lightweight crypto core has been implemented on a 65 nm CMOS testchip by using the developed TEL library and compared against a SABL implementation of the same crypto core on the same chip. Comparisons have been carried out by means of extensive transistor level simulations and measurements on the 65 nm testchip which allowed to evaluate a wide set of security metrics. Experimental results have shown a strong reduction of the information leakage with respect to the sense amplifier based logic logic style under mismatched load conditions with an improvement in the measurements to disclosure of more than three orders of magnitude.
机译:本文介绍了双轨预充电逻辑系列的实验结果,该系列功耗对不平衡负载条件不敏感。所提出的逻辑系列基于时间封闭逻辑(TEL)编码,可以看作是基于延迟的双轨预充电逻辑(DDPL)逻辑样式的改进。 DDPL逻辑门已经过重新设计,可以避免早期评估的影响并减少面积和功耗。 TEL安全门和触发器库已在65 nm CMOS工艺中实现。开发的库允许采用半定制设计流程(自动布局和布线),而对互补线的布线没有任何限制。通过使用开发的TEL库,已在65 nm CMOS测试芯片上实现了四位轻量级加密内核,并将其与同一芯片上相同加密内核的SABL实现进行了比较。通过在65 nm测试芯片上进行广泛的晶体管级仿真和测量来进行比较,从而可以评估各种安全指标。实验结果表明,在负载不匹配的情况下,与基于感测放大器的逻辑逻辑方式相比,信息泄漏得到了极大的减少,并且测量结果的改进超过了三个数量级。

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