机译:X-SRAM:在CMOS静态随机访问存储器中启用内存中的布尔计算
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA;
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA;
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA;
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA;
Random access memory; Standards; Computer architecture; Transistors; Throughput; Sensors; Logic gates;
机译:采用28 nm高k /金属栅平面体CMOS技术的高度对称10晶体管2读/写双端口静态随机存取存储器位单元设计
机译:批量CMOS静态随机存取存储单元中四个写入稳定性指标的比较和统计分析
机译:温度变化敏感的64位静态随机存取存储器阵列,采用45 nm CMOS技术的退出位线技术
机译:现代商用现货(COTS)单片1M和4M CMOS静态随机存取存储器(SRAM)器件中的极高闩锁敏感性
机译:总剂量辐射对CMOS 1M位动态随机存取存储器的影响。
机译:整体式3D逻辑电路和静态随机存取存储器的电耦合和仿真
机译:X-sRam:在CmOs静态随机中启用存储器内布尔计算 访问记忆
机译:16 K CmOs(互补金属氧化物半导体)sRam(静态随机存取存储器)的单事件翻转率估计