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Memristive Hebbian Plasticity Model: Device Requirements for the Emulation of Hebbian Plasticity Based on Memristive Devices

机译:忆阻性Hebbian可塑性模型:基于忆阻性器件模拟Hebbian可塑性的设备要求

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In this work we present a phenomenological model for synaptic plasticity suitable to describe common plasticity measurements of memristive devices. We show evidence that the presented model is basically compatible with advanced biophysical plasticity models, which account for a large body of experimental data on spike-timing-depending plasticity (STDP) as an asymmetric form of Hebbian learning. The basic characteristics of our model are a saturation of the synaptic weight growth and a weight dependent learning rate. Moreover, it accounts for common resistive switching behaviors of memristive devices under voltage pulse application and allows to study essential requirements of individual memristive devices for the emulation of Hebbian plasticity in neuromorphic circuits. In this respect, memristive devices based on mixed ionic/electronic and one exclusively electronic mechanism are explored. The ionic/electronic devices consist of the layer sequence metal/isolator/metal and represent today’s most popular devices. The electronic device is a MemFlash-cell which is based on a conventional floating gate transistor in a diode configuration wiring scheme exhibiting a memristive (pinched) I-V characteristic.
机译:在这项工作中,我们提出了一种突触可塑性的现象学模型,适用于描述忆阻装置的常见可塑性测量。我们显示的证据表明,所提出的模型基本上与高级生物物理可塑性模型兼容,后者解释了大量的关于依赖尖峰时间的可塑性(STDP)的实验数据,作为不对称形式的Hebbian学习。我们模型的基本特征是突触重量增长的饱和和重量依赖的学习率。此外,它说明了在电压脉冲作用下忆阻器的常见电阻切换行为,并允许研究单个忆阻器在神经形态电路中模拟赫比塑性的基本要求。在这方面,探索了基于混合离子/电子和一种专门的电子机制的忆阻器件。离子/电子设备由金属/绝缘体/金属的层序组成,代表了当今最流行的设备。该电子设备是一个MemFlash单元,它基于传统的浮栅晶体管,采用二极管配置布线方案,具有忆阻(收缩)IV特性。

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