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首页> 外文期刊>IEEE Photonics Technology Letters >The frequency behavior of InGaAs-AlInAs metal-semiconductor-metal photodetectors at low bias voltages for data communication applications
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The frequency behavior of InGaAs-AlInAs metal-semiconductor-metal photodetectors at low bias voltages for data communication applications

机译:InGaAs-AlInAs金属-半导体-金属光电探测器在低偏置电压下的频率行为,用于数据通信应用

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摘要

The authors have fabricated lattice matched InGaAs/AlInAs metal-semiconductor-metal photodetectors on InP. The detectors have very low dark currents, low capacitance, and good responsivity, corresponding to at least 95% internal collection efficiency. It is demonstrated that multigigahertz bandwidths, as measured in the frequency domain, are achievable at typical logic-level bias voltages, and that therefore these detectors are viable candidates for long-wavelength data communication applications.
机译:作者已经在InP上制造了晶格匹配的InGaAs / AlInAs金属-半导体-金属光电探测器。检测器具有非常低的暗电流,低电容和良好的响应度,相当于至少95%的内部收集效率。事实证明,在频域中测得的数千兆赫兹带宽可在典型的逻辑电平偏置电压下实现,因此,这些检测器是长波长数据通信应用的可行选择。

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