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Mitigation of Inter-Cell Interference in Flash Memory With Capacity-Approaching Variable-Length Constrained Sequence Codes

机译:利用容量接近的可变长度约束序列码缓解闪存中的小区间干扰

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We propose using variable-length constrained sequence codes to mitigate inter-cell interference (ICI) in all-bit-line flash memory with multi-page programming for single-level cell, multi-level cell, and triple-level cell flash memory structures. We outline constraints that mitigate ICI in these systems based on an observation of the Gray mapping of data symbols, and we derive the capacity of each constraint. Based on a finite state machine representation of each constraint, we construct variable-length constrained sequence codes with code rates very close to capacity to mitigate ICI in these flash memories. We then exploit the inherent error control capability of the proposed constrained sequence codes to alleviate error propagation. Finally, we integrate these codes with error control codes and present simulation results that demonstrate the enhanced bit error rate performance that can be achieved.
机译:我们建议使用可变长度约束序列码来减轻全位线闪存中的单元间干扰(ICI),并针对单级单元,多级单元和三级单元闪存结构进行多页编程。我们基于对数据符号的灰色映射的观察,概述了缓解这些系统中ICI的约束,并得出了每个约束的容量。基于每个约束的有限状态机表示,我们构造了可变长度受限序列码,其码率非常接近缓解这些闪存中ICI的能力。然后,我们利用提出的约束序列码的固有错误控制能力来减轻错误传播。最后,我们将这些代码与错误控制代码集成在一起,并给出了仿真结果,这些结果证明了可以实现的增强的误码率性能。

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