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Determination of the wavelength dependence of Auger recombination in long-wavelength quantum-well semiconductor lasers using hydrostatic pressure

机译:利用静水压力测定长波长量子阱半导体激光器中俄歇复合的波长依赖性

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The variation of the threshold current of an unstrained 1.48-/spl mu/m InGaAsP quantum-well (QW) laser has been measured as a function of hydrostatic pressure up to 27 kbar. We combine this result with theoretical calculations to extract the bandgap dependence of the Auger coefficient, C, over a range of 200 meV. We find that over this range C reduces by a factor of about three. We have calculated the bandgap dependence of the main Auger processes and conclude that the dominant Auger process over this wavelength range could either be the phonon-assisted CHCC process or the band-to-band CHSH process. Based on this result, we have estimated the threshold current density of strained and unstrained lasers with wavelengths ranging from 1.75 to 1.3 /spl mu/m using both these processes. We get good agreement between theory and experiment in both cases and show that Auger recombination is the dominant current contribution in 1.5- and 1.3-/spl mu/m devices.
机译:已经测量了无应变的1.48- / splμm/ m InGaAsP量子阱(QW)激光器的阈值电流随高达27 kbar的静水压力的变化。我们将此结果与理论计算结合起来,以提取俄歇系数C在200 meV范围内的带隙依赖性。我们发现,在此范围内,C降低了约三倍。我们已经计算了主要俄歇过程的带隙依赖性,并得出结论,在该波长范围内的主要俄歇过程可能是声子辅助CHCC过程或带间CHSH过程。基于此结果,我们使用这两种方法估算了波长为1.75至1.3 / spl mu / m的应变和非应变激光器的阈值电流密度。在这两种情况下,我们在理论和实验之间都取得了很好的一致性,并表明俄歇复合是1.5-和1.3- / spl mu / m器件的主要电流贡献。

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