Circuit analysis of an ultrafast junction mixing scanning tunnelingmicroscope

摘要

A lumped element circuit model for the operation of a junctionnmixing scanning tunneling microscope (JM-STM) is presented. Fits fromnthis model show excellent agreement with experimental results in thenpicosecond time regime. The tip sample capacitance employed in the modelnwas calculated to be 33 fF, using the method of images. By varying thencapacitance, various tip/sample geometries can be investigated. Testingnthe response of the model tunnel junction, for faster electrical pulses,nsuggests how the JM-STM can be pushed into the femtosecond time regime