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Two-dimensional Mathematical Analysis of a Planar Type Junction Field-effect Transistor

机译:平面型结型场效应晶体管的二维数学分析

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A two-dimensional mathematical analysis is presented of the steady-state mechanisms of operation within a planar type junction field-effect transistor (JFET). This analysis shows that the potential distribution within the source-drain channel follows from solutions of Poisson's equation rather than from Laplace's equation. In particular, velocity-limited carrier transport produces a region of carrier accumulation in a region of the source-drain channel previously assumed to be depleted of carriers by the gate junction space-charge layers. The results of this two-dimensional mathematical analysis are presented in graphic form.
机译:对平面型结型场效应晶体管(JFET)内的稳态工作机制进行了二维数学分析。该分析表明,源漏通道内的电势分布遵循泊松方程的解而不是拉普拉斯方程。特别地,速度受限的载流子传输在先前假定为通过栅极结空间电荷层耗尽载流子的源极-漏极沟道的区域中产生载流子累积的区域。二维数学分析的结果以图形形式显示。

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