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Efficient estimation of drift parameters in stochastic volatility models

机译:随机波动率模型中漂移参数的有效估计

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摘要

We study the parametric problem of estimating the drift coefficient in a stochastic volatility model $Y_{t}=int_{0}^{t}sqrt{V_{s}},mathrm {d}W_{s}$ , where Y is a log price process and V the volatility process. Assuming that one can recover the volatility, precisely enough, from the observation of the price process, we construct an efficient estimator for the drift parameter of the diffusion V. As an application we present the efficient estimation based on the discrete sampling $(Y_{idelta_{n}})_{i=0,dots,n}$ with δ n →0 and n δ n →∞. We show that our setup is general enough to cover the case of ‘microstructure noise’ for the price process as well.
机译:我们研究估计随机波动率模型$ Y_ {t} = int_ {0} ^ {t} sqrt {V_ {s}},mathrm {d} W_ {s} $的参数问题,其中Y为对数价格过程和V波动过程。假设可以从价格过程的观察中准确地恢复到波动率,我们构造了扩散V的漂移参数的有效估计器。作为一种应用,我们提出了基于离散采样$(Y_ { idelta_ {n}})_ {i = 0,dots,n} $,其中δn →0和nδn →∞。我们证明,我们的设置足以涵盖价格过程中“微结构噪音”的情况。

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