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首页> 外文期刊>IEE Proceedings. Part I >Concurrent error detection and fault location in a gracefully degrading ATM switch
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Concurrent error detection and fault location in a gracefully degrading ATM switch

机译:同时降级的ATM交换机中的并发错误检测和故障定位

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摘要

The authors present a concurrent error detection and fault location technique for a gracefully degrading ATM switch. The switch architecture has multiple data and control planes, each of which has an identical banyan topology. Cell headers are routed via the control planes to reserve their routing paths on the data planes. Multiplicity of data planes for enhancing performance is utilised to detect errors and locate faults during normal operation. An efficient algorithm is developed to locate faulty links or switching elements while normal switching operation is being performed. Periodic checking, where the test interval is determined dynamically depending on the traffic load, is suggested to minimise the performance degradation. The identified faulty data planes can also be made usable for cell transmission.
机译:作者提出了一种用于同时降级ATM交换机的并发错误检测和故障定位技术。交换机体系结构具有多个数据和控制平面,每个平面都有相同的榕树拓扑。信元头通过控制平面路由,以在数据平面上保留其路由路径。利用多个数据平面来增强性能,可在正常操作期间检测错误并定位故障。开发了一种有效的算法来在执行正常交换操作时定位故障链路或交换元件。建议进行定期检查,在该检查间隔中根据流量负载动态确定测试间隔,以最大程度地降低性能下降。所识别的故障数据平面也可以用于小区传输。

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