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机译:Pd-In欧姆接触对通过扫描电子束和快速热退火形成的n-GaAs的热稳定性
Dept. of Electr. & Electron. Eng., Western Australia Univ., Nedlands, WA, Australia;
III-V semiconductors; ageing; annealing; contact resistance; electron beam annealing; gallium arsenide; indium; metallisation; ohmic contacts; palladium; semiconductor-metal boundaries; 25 hrs; 500 degC; GaAs; Pd-In-GaAs; annealed contacts; high temperature ageing; low resistance Pd-In ohmic contacts; multilayer metallisation; n-GaAs; rapid thermal annealing; scanned electron beam annealing; specific contact resistance; surface morphology; thermal stability;
机译:Au / W / Ti欧姆接触(NH {sub} 4){sub} 2S处理的n-GaAs的电性能和热稳定性
机译:Au / W / Ti欧姆接触(NH {sub} 4){sub} 2S处理的n-GaAs的电性能和热稳定性
机译:Au / W / Ti欧姆触点的电性能和热稳定性(NH {sub} 4){sub} 2s处理的n-gaas
机译:非合金欧姆接触n-GaAs的热稳定性
机译:快速热退火欧姆触点与砷化镓的比较电特性。
机译:在不同的注入后退火后p型铝注入的4H-SiC层上的欧姆接触
机译:通过快速热退火形成的低电阻欧姆接触到p-Inp的传输机制
机译:采用高温快速热退火进行自对准加工的n型Gaas欧姆接触