首页> 外文期刊>Electronics Letters >1.5 mu m GaInAs/GaInAsP graded index separate confinement heterostructure multiple quantum well (GRIN-SCH-MQW) laser diodes grown by metalorganic chemical vapour deposition (MOCVD)
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1.5 mu m GaInAs/GaInAsP graded index separate confinement heterostructure multiple quantum well (GRIN-SCH-MQW) laser diodes grown by metalorganic chemical vapour deposition (MOCVD)

机译:通过金属有机化学气相沉积(MOCVD)生长的1.5μm的GaInAs / GaInAsP梯度折射率分离禁区异质结构多量子阱(GRIN-SCH-MQW)激光二极管

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摘要

Very low threshold current density GaInAs/GaInAsP GRIN-SCH-MQW laser diodes grown by MOCVD emitting at 1.5 mu m are demonstrated for the first time. The average threshold current density for 375 mu m cavity length devices (200 mu m width) was 1.2 KA/cm/sup 2/, which is the lowest value reported for GaInAs/InP laser diodes.
机译:首次展示了通过MOCVD生长的极低阈值电流密度GaInAs / GaInAsP GRIN-SCH-MQW激光二极管,其发射电流为1.5μm。 375微米腔长器件(200微米宽度)的平均阈值电流密度为1.2 KA / cm / sup 2 /,这是报道的GaInAs / InP激光二极管的最低值。

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