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Effects of interface and bulk recombination on switching characteristics of AlGaAs/GaAs pnpn bistable device

机译:界面和体重组对AlGaAs / GaAs pnpn双稳态器件开关特性的影响

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Device modeling is used to analyze the steady-state current voltage characteristics of double heterostructure AlGaAs/GaAs pnpn switches in the presence of interface and bulk recombination mechanisms. Simulation results show that the holding current increases significantly by shortening the carrier lifetime at heterojunction interface, while the holding voltage and breakover point remain relatively constant. Results also indicate that shortening the carrier lifetime in the inner pn homojunction region only increases the off-state leakage current. These results are in agreement with experimental data obtained by others, and may be used to design a device with optimum switching performance.
机译:器件建模用于分析存在界面和本体复合机制的双异质结构AlGaAs / GaAs pnpn开关的稳态电流电压特性。仿真结果表明,保持电流通过缩短异质结界面处的载流子寿命而显着增加,而保持电压和转折点保持相对恒定。结果还表明,缩短内部pn同质结区域中的载流子寿命只会增加截止态泄漏电流。这些结果与其他人获得的实验数据一致,可用于设计具有最佳开关性能的器件。

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