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Analysis of signal to noise ratio of photoconductive layered solid-state imaging device

机译:光电导分层固态成像器件的信噪比分析

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摘要

The signal to noise ratio of the photoconductive layered solid-state imaging device (PSID) has been theoretically derived. In this analysis the noise suppression effect due to residual signal electrons in the storage diode after read-out operation, the optical shot noise, and the fluctuation of the number of transferred signal electrons due to incomplete readout signal electrons were considered. The obtained result showed good agreement to the experimental result.
机译:理论上已经推导了光导层固态成像装置(PSID)的信噪比。在该分析中,考虑了由于读出操作之后存储二极管中的残留信号电子,光学散粒噪声以及由于不完整的读出信号电子而导致的转移信号电子数量波动引起的噪声抑制效果。所得结果与实验结果吻合良好。

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