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首页> 外文期刊>IEEE Transactions on Electron Devices >Progressive Development of Superjunction Power MOSFET Devices
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Progressive Development of Superjunction Power MOSFET Devices

机译:超结功率MOSFET器件的逐步发展

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摘要

The originally proposed superjunction (SJ) power MOSFET structure with interdigitated p-n columns is highly recognized for its higher voltage-blocking capability and lower specific on -state resistance. However, in practice, the performance of SJ devices is greatly handicapped due to difficulties in the formation of perfect charge-balanced p-n columns by the limitation of fabrication process technology, particularly, for devices with small p-n column widths at low voltage ratings. Recently developed structures of polysilicon-flanked and oxide-bypassed SJ MOSFETs are to overcome the conventional SJ device fabrication limitation. The follow-up development on extending the scope of these recently reported device structures to lateral SJ structures, which is suitable for SJ power integrated circuits, is reported for the first time. In this paper, detailed descriptions of the progressive development and the technical advancement of several SJ MOSFET structures are presented with both simulation and experimental results.
机译:最初提出的具有交叉p-n列的超结(SJ)功率MOSFET结构因其较高的电压阻断能力和较低的导通态电阻而广受认可。然而,实际上,由于制造工艺技术的限制,特别是对于低额定电压下具有较小p-n列宽度的器件,由于难以形成完美的电荷平衡p-n列,SJ器件的性能受到很大的限制。最近开发的多晶硅侧翼和旁路氧化物的SJ MOSFET的结构将克服常规SJ器件的制造限制。首次报道了有关将这些最近报道的器件结构的范围扩展到适用于SJ电源集成电路的横向SJ结构的后续开发。本文通过仿真和实验结果,详细描述了几种SJ MOSFET结构的逐步发展和技术进步。

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