首页> 外文期刊>Electron Devices, IEEE Transactions on >Polymer Solid-Electrolyte Switch Embedded on CMOS for Nonvolatile Crossbar Switch
【24h】

Polymer Solid-Electrolyte Switch Embedded on CMOS for Nonvolatile Crossbar Switch

机译:嵌入式CMOS上的聚合物固体电解质开关,用于非易失性纵横开关

获取原文
获取原文并翻译 | 示例

摘要

A polymer solid-electrolyte (PSE) switch has been embedded in a 90-nm-node CMOS featuring a forming-less programming and extremely high on/off ratio of $hbox{10}^{5}$. A fast programming of 10 ns is also demonstrated for 50-$hbox{nm}phi$ 1 k-b array by introducing the PSE switches integrated with a fully logic compatible process below 350 $^{circ}hbox{C}$. A high free volume in the PSE is supposed to result in the smooth formation of the Cu bridge without destroying the electrolyte, thereby also resulting in forming-less programming and high breakdown voltage. High disturbance reliability ( $T_{50}$; 50% fail) is extracted to be over 10 years at operation condition. The improved switching characteristics enable us to accurately program the crossbar circuit in a practical scale (32 $times$ 32) without cell transistors. The developed switch is a strong candidate for realizing a low-power and low-cost nonvolatile programmable logic.
机译:聚合物固体电解质(PSE)开关已嵌入到90纳米节点CMOS中,具有无成型编程和$ hbox {10} ^ {5} $的超高开关率的特点。通过引入集成了低于350 $ hbox {C} $的完全逻辑兼容过程的PSE开关,还证明了对50-hbox {nm} phi $ 1 k-b阵列10 ns的快速编程。 PSE中的高自由体积被认为可以在不破坏电解质的情况下平滑地形成Cu桥,从而也可以减少编程次数和击穿电压。在运行条件下,高干扰可靠性($ T_ {50} $; 50%失败)被提取为超过10年。改进的开关特性使我们能够在没有单元晶体管的情况下以实用规模(32×32)准确地对纵横电路进行编程。所开发的开关是实现低功耗,低成本非易失性可编程逻辑的有力候选。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号