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Implications of Electrical Crosstalk for High Density Aligned Array of Single-Wall Carbon Nanotubes

机译:电串扰对单壁碳纳米管高密度排列阵列的影响

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Single-wall carbon nanotube (SWNT) based devices promise a number of applications in flexible electronics, sensing, and optoelectronics. Specifically, devices based on densely packed aligned array of SWNTs are desirable for high drive current. An unintended consequence of dense packing is a new type of electrostatic crosstalk, where a single broken SWNT—at a critical field—may initiate correlated breakdown (CBD) that produces a nanoscale fissure in the channel, and thereby, defines the density limit of the aligned-array devices. In this paper, self-consistent numerical and analytical transport models (coupled to stochastic Monte Carlo simulation) are developed to explore and interpret electrical crosstalk in aligned-array SWNTs, and guidelines for improved design are proposed. Our analysis suggests that a broken SWNT induces localized voltage drop in the neighboring SWNTs, initiating band-to-band-tunneling/impact-ionization current, and corresponding breakdown electric-field is m. The fissure profile is defined by an interplay between the initial (spatial) distribution of broken SWNTs and the correlation defined by the electrostatic crosstalk. Results are summarized in a density-field phase diagram that distinguishes regions of safe operation versus random breakdown/CBD. The critical field is ultimately defined by properties of the tubes (i.e., diameter distribution, doping, and size of the breakdown spot) and the substrate (e.g., dielectric and thickness).
机译:基于单壁碳纳米管(SWNT)的设备有望在柔性电子,传感和光电子领域中得到许多应用。具体地,基于SWNT的密集排列的对准阵列的设备对于高驱动电流是合乎需要的。密集堆积的意外结果是一种新型的静电串扰,其中单个破碎的SWNT(在临界场)可能会引发相关击穿(CBD),从而在通道中产生纳米级裂隙,从而定义了通道的密度极限。对齐阵列设备。在本文中,建立了自洽的数值和解析输运模型(耦合到随机蒙特卡洛模拟)来探索和解释对准阵列单壁碳纳米管中的电串扰,并提出了改进设计的指南。我们的分析表明,断裂的SWNT会在相邻的SWNT中引起局部电压降,从而启动带间隧道/冲击电离电流,并且相应的击穿电场为m。裂缝轮廓由断裂的SWNT的初始(空间)分布与静电串扰定义的相关性之间的相互作用定义。结果总结在密度场相图中,区分了安全操作区域与随机击穿/ CBD区域。临界场最终由管的特性(即,直径分布,掺杂和击穿点的尺寸)和基体(例如,电介质和厚度)定义。

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