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机译:考虑源极/漏极耗尽效应的电介质口袋双栅极无结FET的二维分析阈值电压模型
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Department of Electronics Engineering, IIT (BHU) Varanasi, Varanasi, India;
Electric potential; Threshold voltage; Logic gates; Mathematical model; MOSFET; Analytical models; Boundary conditions;
机译:长通道无结双栅晶体管的电势,阈值电压和漏极电流的分析模型
机译:具有垂直高斯型掺杂分布的双栅极无结FET的沟道电势和阈值电压的分析模型
机译:具有局部电荷的无结双栅极MOSFET的分析阈值电压模型
机译:双栅肖特基势垒源极/漏极MOSFET的解析阈值电压模型
机译:45 nm栅极长度n-MOSFET陷阱引起的阈值电压波动仿真的比较分析和分析模型预测。
机译:具有InAs / Si异质结和源极口袋结构的双栅隧道FET的漏极电流模型
机译:具有高k栅极电介质的GeOI / GeON MOSFET的二维分析阈值电压模型