首页> 外文期刊>Electron Device Letters, IEEE >Novel a-Si:H AMOLED Pixel Circuit to Ameliorate OLED Luminance Degradation by External Detection
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Novel a-Si:H AMOLED Pixel Circuit to Ameliorate OLED Luminance Degradation by External Detection

机译:新型a-Si:H AMOLED像素电路可通过外部检测改善OLED的亮度下降

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摘要

This letter presents a novel hydrogenated amorphous silicon (a-Si:H) active-matrix organic light-emitting diode (OLED) pixel circuit that compensates for the threshold voltage shift of TFT using an internal compensated structure and reduces luminance decay by external detection method, based on the interdependence between the luminance degradation of OLED and the decrease in current under constant voltage bias stress. Experimental results demonstrate that the luminance of the OLED device with the proposed external detection method is more stable than that with the conventional 2T1C pixel circuit.
机译:这封信提出了一种新颖的氢化非晶硅(a-Si:H)有源矩阵有机发光二极管(OLED)像素电路,该电路使用内部补偿结构来补偿TFT的阈值电压偏移并通过外部检测方法减少亮度衰减,基于OLED的亮度下降与恒定电压偏置应力下电流减小之间的相互依赖性。实验结果表明,与传统的2T1C像素电路相比,所提出的外部检测方法的OLED器件的亮度更稳定。

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