首页> 外文期刊>Electron Device Letters, IEEE >GaN-Based LEDs With Al-Doped ZnO Transparent Conductive Layer Grown by Metal Organic Chemical Vapor Deposition: Ultralow Forward Voltage and Highly Uniformity
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GaN-Based LEDs With Al-Doped ZnO Transparent Conductive Layer Grown by Metal Organic Chemical Vapor Deposition: Ultralow Forward Voltage and Highly Uniformity

机译:通过金属有机化学气相沉积法生长的具有Al掺杂的ZnO透明导电层的GaN基LED:超低正向电压和高度均匀性

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摘要

In this letter, InGaN/GaN multiquantum well LEDs were fabricated with aluminum-doped zinc oxide (AZO) transparent conductive layer (TCL) grown by metal organic chemical vapor deposition (MOCVD) on -InGaN contact layer. Ultralow forward voltage () of 2.86 V at 20 mA was obtained, attributing to the epitaxial-like excellent interface between AZO/-InGaN contact layer confirmed by high-resolution transmission electron microscopy. The most worthy is that the uniformity can be demonstrated on a 2-in wafer with a standard deviation of 0.02 V. Combined with the excellent light extraction, the MOCVD grown AZO-TCL is expected to be an alternative of tin-doped indium oxide in GaN-based LEDs for mass production.
机译:在这封信中,InGaN / GaN多量子阱LED是通过在-InGaN接触层上通过金属有机化学气相沉积(MOCVD)生长的铝掺杂氧化锌(AZO)透明导电层(TCL)制成的。在20 mA下获得2.86 V的超低正向电压(),这归因于高分辨率透射电子显微镜证实的AZO / -InGaN接触层之间的外延状出色界面。最值得一提的是,其均匀性可以在标准偏差为0.02 V的2英寸晶圆上得到证明。结合出色的光提取能力,MOCVD生长的AZO-TCL有望成为掺杂锡的氧化铟的替代品。基于GaN的LED批量生产。

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