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首页> 外文期刊>Electron Device Letters, IEEE >3-bit Resistive RAM Write-Read Scheme Based on Complementary Switching Mechanism
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3-bit Resistive RAM Write-Read Scheme Based on Complementary Switching Mechanism

机译:基于互补切换机制的3位电阻RAM读写方案

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摘要

While standard bipolar switching RRAM memory devices can be programmed into different resistance states, the complementary switching mechanism allows for two distinct switching locations that each can be programmed to these resistance states. In this letter, we present a technique to discriminate these switching locations and report on a novel scheme allowing for sub-μs pulse write and read of eight different logic states in Pt/Ta2O5/Ta/Pt devices by using only four different resistive states. Thus, in addition to the multilevel capability of bipolar switching devices, double the information can be stored and read in a single complementary switching device.
机译:虽然可以将标准的双极开关RRAM存储设备编程为不同的电阻状态,但是互补开关机制允许两个不同的开关位置,每个位置都可以编程为这些电阻状态。在这封信中,我们提出了一种区分这些开关位置的技术,并报告了一种新颖的方案,该方案允许通过仅使用四种不同的电阻性状态对Pt / Ta2O5 / Ta / Pt器件中的八个不同逻辑状态进行亚μs脉冲写入和读取。因此,除了双极开关设备的多级能力之外,还可以在单​​个互补开关设备中存储和读取两倍的信息。

著录项

  • 来源
    《Electron Device Letters, IEEE 》 |2017年第4期| 449-452| 共4页
  • 作者单位

    Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, Aachen, Germany;

    Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, Aachen, Germany;

    Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, Aachen, Germany;

    Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, Aachen, Germany;

    Peter Grünberg Institut, Forschungszentrum Jülich GmbH, Jülich, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Switches; Resistance; Voltage measurement; Electrical resistance measurement; Electrodes; Pulse measurements; Writing;

    机译:开关;电阻;电压测量;电阻测量;电极;脉冲测量;书写;

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