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A GaN-Based LED With Perpendicular Structure Fabricated on a ZnO Substrate by MOCVD

机译:MOCVD在ZnO衬底上形成垂直结构的GaN基LED

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摘要

A perpendicular InGaN/GaN multiple-quantum- wells structure on ZnO substrate for blue light emitting diode (LED) was successfully fabricated by use of Metal-organic Chemical Vapor Deposition (MOCVD). During the growing process of GaN-based materials on ZnO substrates, the low-temperature-grown GaN buffer layer, inserted between ZnO substrate and undoped GaN layer, prevented the Zn and O from diffusing from ZnO substrate into the n-GaN layer. This thin GaN buffer layer, mainly as a insulating layer, was grown at relatively low temperature of 530 $^{circ}{hbox{C}}$ . By using our method, an integrated LED with ZnO substrate can be fabricated with a crack-free GaN film on (0001) ZnO substrate by MOCVD using this method. The epilayer crystalline structure has been measured by atomic force microscopy (AFM), and the optical properties of the LED were also characterized by photoluminescence and Current-Voltage characteristic curve.
机译:利用金属有机化学气相沉积法(MOCVD)成功地在用于蓝色发光二极管(LED)的ZnO衬底上制造了垂直的InGaN / GaN多量子阱结构。在ZnO衬底上生长GaN基材料的过程中,插入ZnO衬底与未掺杂GaN层之间的低温生长GaN缓冲层可防止Zn和O从ZnO衬底扩散到n-GaN层中。该GaN薄缓冲层(主要作为绝缘层)在530°C的较低温度下生长。通过使用我们的方法,可以使用MOCVD在(0001)ZnO基板上用无裂纹的GaN膜制造带有ZnO基板的集成LED。通过原子力显微镜(AFM)测量了外延层的晶体结构,并且还通过光致发光和电流-电压特性曲线表征了LED的光学特性。

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