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Residual Lattice Strain and Phase Distribution in Ti-6Al-4V Produced by Electron Beam Melting

机译:通过电子束熔化产生的Ti-6AL-4V中的残留晶格应变和相位分布

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Residual stress/strain and microstructure used in additively manufactured material are strongly dependent on process parameter combination. With the aim to better understand and correlate process parameters used in electron beam melting (EBM) of Ti-6Al-4V with resulting phase distributions and residual stress/strains, extensive experimental work has been performed. A large number of polycrystalline Ti-6Al-4V specimens were produced with different optimized EBM process parameter combinations. These specimens were post-sequentially studied by using high-energy X-ray and neutron diffraction. In addition, visible light microscopy, scanning electron microscopy (SEM) and electron backscattered diffraction (EBSD) studies were performed and linked to the other findings. Results show that the influence of scan speed and offset focus on resulting residual strain in a fully dense sample was not significant. In contrast to some previous literature, a uniform α- and β-Ti phase distribution was found in all investigated specimens. Furthermore, no strong strain variations along the build direction with respect to the deposition were found. The magnitude of strain in α and β phase show some variations both in the build plane and along the build direction, which seemed to correlate with the size of the primary β grains. However, no relation was found between measured residual strains in α and β phase. Large primary β grains and texture appear to have a strong effect on X-ray based stress results with relatively small beam size, therefore it is suggested to use a large beam for representative bulk measurements and also to consider the prior β grain size in experimental planning, as well as for mathematical modelling.
机译:用于加成制造材料的残余应力/应变和微观结构强烈依赖于工艺参数组合。随着旨在更好地了解和相关的Ti-6Al-4V的电子束熔化(EBM)的过程参数,通过得到的相分布和残余应力/菌株,已经进行了广泛的实验工作。用不同优化的EBM工艺参数组合生产大量多晶Ti-6AL-4V样本。通过使用高能X射线和中子衍射来依次研究这些样本。此外,进行可见光显微镜,扫描电子显微镜(SEM)和电子背散射衍射(EBSD)研究并与其他研究结果联系起来。结果表明,扫描速度和偏移聚焦对完全致密样品中的残留菌株的影响不显着。与以前的一些文献相反,在所有研究标本中发现了均匀的α-和β-Ti相分布。此外,发现,未发现沿着构建方向的强应变变化。 α和β相中的应变幅度显示在构建平面和沿​​构建方向上的一些变化,似乎与初级β颗粒的尺寸相关。然而,在α和β相中测量的残留菌株之间没有发现任何关系。大初级β谷物和纹理似乎对基于X射线的应力产生了强烈的效果,具有相对小的光束尺寸,因此建议使用大梁进行代表性散装测量,并考虑实验规划中的先前β晶粒尺寸以及数学建模。

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