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Residual Lattice Strain and Phase Distribution in Ti-6Al-4V Produced by Electron Beam Melting

机译:电子束熔化产生的Ti-6Al-4V中的残余晶格应变和相分布

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摘要

Residual stress/strain and microstructure used in additively manufactured material are strongly dependent on process parameter combination. With the aim to better understand and correlate process parameters used in electron beam melting (EBM) of Ti-6Al-4V with resulting phase distributions and residual stress/strains, extensive experimental work has been performed. A large number of polycrystalline Ti-6Al-4V specimens were produced with different optimized EBM process parameter combinations. These specimens were post-sequentially studied by using high-energy X-ray and neutron diffraction. In addition, visible light microscopy, scanning electron microscopy (SEM) and electron backscattered diffraction (EBSD) studies were performed and linked to the other findings. Results show that the influence of scan speed and offset focus on resulting residual strain in a fully dense sample was not significant. In contrast to some previous literature, a uniform α- and β-Ti phase distribution was found in all investigated specimens. Furthermore, no strong strain variations along the build direction with respect to the deposition were found. The magnitude of strain in α and β phase show some variations both in the build plane and along the build direction, which seemed to correlate with the size of the primary β grains. However, no relation was found between measured residual strains in α and β phase. Large primary β grains and texture appear to have a strong effect on X-ray based stress results with relatively small beam size, therefore it is suggested to use a large beam for representative bulk measurements and also to consider the prior β grain size in experimental planning, as well as for mathematical modelling.
机译:增材制造材料中使用的残余应力/应变和微观结构在很大程度上取决于工艺参数的组合。为了更好地理解并将Ti-6Al-4V的电子束熔化(EBM)中使用的工艺参数与所产生的相分布和残余应力/应变相关联,已进行了广泛的实验工作。使用不同的优化EBM工艺参数组合生产了大量多晶Ti-6Al-4V标本。通过使用高能X射线和中子衍射对这些标本进行了后序研究。此外,还进行了可见光显微镜,扫描电子显微镜(SEM)和电子背散射衍射(EBSD)研究,并将其与其他发现相关联。结果表明,扫描速度和偏移聚焦对完全致密样品中产生的残余应变的影响不显着。与一些先前的文献相比,在所有研究的样品中均发现了均匀的α-和β-Ti相分布。此外,没有发现相对于沉积沿着构建方向的强烈应变变化。 α相和β相的应变大小在构造平面和沿着构造方向均显示出一些变化,这似乎与初级β晶粒的尺寸有关。然而,在α相和β相中测得的残余应变之间未发现任何关系。较大的初级β晶粒和织构似乎对基于X射线的应力结果有很强的影响,并且光束尺寸相对较小,因此建议使用较大的光束进行代表性的体积测量,并在实验计划中考虑先前的β晶粒尺寸,以及用于数学建模。

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