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Influence of Parasitic Inductances on Switching Performance of SiC MOSFET

机译:寄生电感对SiC MOSFET开关性能的影响

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Compared to the silicon power devices, silicon carbide device has shorter switch time. Hence, as a result of the faster transition of voltage (dv/dt) and current (di/dt) in SiC MOSFET, the influence of parasitic parameters on SiC MOSFET’s switching transient is more serious. This paper gives an experimental study of the influence of parasitic inductance on SiC MOSFET’s switching characteristics. Most significance parameters are the parasitic inductances of gate driver loop and power switching loop. These include the SiC MOSFET package’s parasitic inductance, interconnect inductance and the parasitic inductance of dc link PCB trace. This paper therefore focuses on analysis and comparison of different parasitic parameters under various operation conditions in terms of their effect on overvoltage, overcurrent and switching power loss.
机译:与硅功率器件相比,碳化硅器件的开关时间更短。因此,由于SiC MOSFET中的电压(dv / dt)和电流(di / dt)更快地跃迁,寄生参数对SiC MOSFET的开关瞬变的影响更加严重。本文通过实验研究了寄生电感对SiC MOSFET开关特性的影响。最重要的参数是栅极驱动器环路和功率开关环路的寄生电感。其中包括SiC MOSFET封装的寄生电感,互连电感和直流链路PCB走线的寄生电感。因此,本文着重分析和比较了各种寄生参数在各种工作条件下对过电压,过电流和开关功率损耗的影响。

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