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首页> 外文期刊>Applied and Environmental Microbiology >Exploration of Inorganic C and N Assimilation by Soil Microbes with Time-of-Flight Secondary Ion Mass Spectrometry
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Exploration of Inorganic C and N Assimilation by Soil Microbes with Time-of-Flight Secondary Ion Mass Spectrometry

机译:飞行时间二次离子质谱法研究土壤微生物对无机碳和氮的吸收

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摘要

Stable C and N isotopes have long been used to examine properties of various C and N cycling processes in soils. Unfortunately, relatively large sample sizes are needed for accurate gas phase isotope ratio mass spectrometric analysis. This limitation has prevented researchers from addressing C and N cycling issues on microbially meaningful scales. Here we explored the use of time-of-flight secondary ion mass spectrometry (TOF-SIMS) to detect 13C and 15N assimilation by individual bacterial cells and to quantify N isotope ratios in bacterial samples and individual fungal hyphae. This was accomplished by measuring the relative abundances of mass 26 (12C14N?) and mass 27 (13C14N? and 12C15N?) ions sputtered with a Ga+ probe from cells adhered to an Si contact slide. TOF-SIMS was successfully used to locate and quantify the relative 15N contents of individual hyphae that grew onto Si contact slides in intimate contact with a model organomineral porous matrix composed of kaolin, straw fragments, and freshly deposited manure that was supplemented with 15NO3?. We observed that the 15N content of fungal hyphae grown on the slides was significantly lower in regions where the hyphae were influenced by N-rich manure than in regions influenced by N-deficient straw. This effect occurred over distances of tens to hundreds of microns. Our data illustrate that TOF-SIMS has the potential to locate N-assimilating microorganisms in soil and to quantify the 15N content of cells that have assimilated 15N-labeled mineral N and shows promise as a tool with which to explore the factors controlling microsite heterogeneities in soil.
机译:长期以来,稳定的C和N同位素一直用于检查土壤中各种C和N循环过程的性质。不幸的是,准确的气相同位素比质谱分析需要相对较大的样本量。这种局限性阻止了研究人员以微生物有意义的规模解决碳和氮循环问题。在这里,我们探索了飞行时间二次离子质谱(TOF-SIMS)的使用,以检测单个细菌细胞对13C和15N的同化作用,并量化细菌样品和单个真菌菌丝中的N同位素比。这是通过测量由Ga +探针从附着在Si接触片上的细胞中溅射得到的质量26(12C14N2)和质量27(13C14N2和12C15N2)离子的相对丰度来实现的。 TOF-SIMS已成功地用于定位和定量生长在硅接触片上的单个菌丝的相对15N含量,该接触菌与由高岭土,稻草碎片和补充了15NO3?的新鲜粪便组成的模型有机矿物多孔基质紧密接触。我们观察到,在玻片上生长的真菌菌丝的15N含量在受富含氮肥的菌丝影响的区域明显低于受缺氮秸秆影响的区域。这种影响发生在数十到数百微米的距离上。我们的数据表明,TOF-SIMS有潜力在土壤中定位可吸收N的微生物,并能够定量吸收已被15N标记的矿物质N吸收的细胞中15N的含量,并显示出有望作为探索控制微地点异质性因素的工具。泥。

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