SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS

摘要

Chitosan composite films were obtained from acetic or lactic acid chitosan solutions and additives such as glycerol, oleic acid, linoleic acid, polyoxyethylenesorbitan monolaureate (Tween 20) and polyoxyethylenesorbitan monooleate (Tween 80) in order to see the influence of the additive on the film formation, microstructure and morphology. The composite films obtained were observed by Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) in order to evaluate the different morphology dependent upon the additives. Both SEM and AFM showed the additive influence on the rugosity and morphology of the film.