...
首页> 外文期刊>Journal of Ovonic Research >Comparison of aluminium thin film deposited on different polymer substrates with thermal evaporation for solar cell applications
【24h】

Comparison of aluminium thin film deposited on different polymer substrates with thermal evaporation for solar cell applications

机译:太阳能电池应用中通过热蒸发法在不同聚合物基板上沉积的铝薄膜的比较

获取原文
   

获取外文期刊封面封底 >>

       

摘要

This paper studies the properties of thermally evaporated 1 μm of aluminium (Al) thin films on polyimide (PI) and polyethylene terephthalate (PET) substrates at room temperature with thermal evaporation in a vacuum of about 3 x 10 -5 Torr for use as window materials for solar cells. Effects of substrate types on the structural and electrical characteristics of the films were studied. Sets of experiments were conducted to optimize the deposition of Al films with appro priate deposition parameters. The deposited films were analyzed with atomic force microscop y (AFM), energy dispersive X -ray (EDX), X- ray diffraction (X RD). Energy dispersive X -ray (EDX) spectra shows presence of Al contacts on both PI and PET substrates. X -ray diffraction (XRD) results illustrate proper formation of Al (111) plane at 38.4 o with full width at half maximum (FWHM) of 0.1968° on both samples. Atomic force microscope (AFM) images reveal that both samples possess smooth surfaces with surface roughness root mean square (RMS) belo w 10 nm.
机译:本文研究了室温下热蒸发1μm的铝(Al)薄膜在聚酰亚胺(PI)和聚对苯二甲酸乙二醇酯(PET)基板上的特性,并在约3 x 10 -5托的真空下进行热蒸发,用作窗口太阳能电池材料。研究了基材类型对薄膜结构和电学特性的影响。进行了一系列实验以优化具有适当沉积参数的Al膜的沉积。用原子力显微镜(AFM),能量色散X射线(EDX),X射线衍射(XRD)分析沉积的膜。能量色散X射线(EDX)光谱显示在PI和PET基板上都存在Al接触。 X射线衍射(XRD)结果表明,在两个样品上,Al(111)平面均在38.4 o处正确形成,半峰全宽(FWHM)为0.1968°。原子力显微镜(AFM)图像显示两个样品均具有光滑的表面,且表面粗糙度的均方根(RMS)小于10 nm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号