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首页> 外文期刊>Optoelectronics and Advanced Materials-Rapid Communications >Calculation of the electrical parameters of aluminium/p type silicon diodes with and without the interfacial insulator layer using thermionic emission theory
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Calculation of the electrical parameters of aluminium/p type silicon diodes with and without the interfacial insulator layer using thermionic emission theory

机译:利用热电子发射理论计算带/不带界面绝缘层的铝/ p型硅二极管的电参数

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TheeffectsofinterfacialinsulatorlayerontheelectricalcharacteristicsofAl/p-Sidiodeshavebeeninvestigatedusingthecurrent-voltage(I-V)characteristicsatroomtemperature.Thevaluesofidealityfactor(n),barrierheight(Phi;b)andseriesresistanceRshavebeendeterminedfromln(I)-Vplots,CheungfunctionsandthemodifiedNordefunctions.ElectricalpropertiesobtainedfromI-VcharacteristicsofthedevicewithinterfacialinsulatorlayerhavebeencomparedwiththeonesobtainedfromI-Vcharacteristicsofthedevicewithoutinterfacialinsulatorlayer.Thecalculatedidealityfactorandbarrierheightare1.49and0.595eVforAl/p-Sidiode,and1.94and0.517eVforAl/SiO2/p-Sidiode,respectively,anditisobservedthattheidealityfactor(n)increasesandbarrierheight(Phi;b)decreaseswithinterfacialinsulatorlayer.TheseriesresistancevaluesobtainedfromCheungfunctionsofthediodewithandwithouttheinterfacialinsulatorlayerareRs=71nbsp;andRs=112,respectively.Current-voltagecharacteristicsandthepower-lawdependencewasdeterminedtobegovernedbyspacecharge-limitedcurrents(SCLC).
机译:TheeffectsofinterfacialinsulatorlayerontheelectricalcharacteristicsofAl /对 - Sidiodeshavebeeninvestigatedusingthecurrent - 电压(IV)characteristicsatroomtemperature.Thevaluesofidealityfactor(N),barrierheight(披; B)andseriesresistanceRshavebeendeterminedfromln(I)-Vplots,CheungfunctionsandthemodifiedNordefunctions.ElectricalpropertiesobtainedfromI-VcharacteristicsofthedevicewithinterfacialinsulatorlayerhavebeencomparedwiththeonesobtainedfromI-Vcharacteristicsofthedevicewithoutinterfacialinsulatorlayer.Thecalculatedidealityfactorandbarrierheightare1.49and0.595eVforAl /对 - Sidiode,AND1。对于Al / SiO2 / p二极管来说,分别为94和0.517eV,并且观察到理想的因数(n)随着界面绝缘层的增加而增加,并且势垒高度(Phi; b)降低。从Cheung功能软二极管获得的串联电阻值与在整个界面绝缘层上的有限电荷通过R分别等于(等于)n的电流等于R等于71 nb。

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