Magnetic and Mossbauer spectroscopy study of Fe-Cr-Al thin films sputtered on Si substrates

摘要

Fe and Fe-Cr-Al thin films, both as sputtered on Si substrates as well as aftersubsequent annealing treatments in hydrogen atmosphere, have been investigated bymeans of X-ray reflectometry, magneto-optic Kerr effect and Mssbauer spectroscopywith respect to structural and related magnetic characteristics. The as deposited filmsare showing chemically disordered bcc structures, assigned to Fe-Si and Fe-Cr-Al-Siphases, respectively, with soft magnetism and magnetic texture, both influenced bythe presence of Si, Cr and Al atoms. The softness of the films as well as the magnetictexture are strongly modified via hydrogenation treatments. In addition, suchtreatments induce the expulsion of Si, Cr and Al atoms from the as deposited phases,providing almost pure Fe films of much well crystallized bcc structure.