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首页> 外文期刊>Materials Research >Electrochemical and optical properties of CeO2-SnO2 and CeO2-SnO2:X (X = Li, C, Si) films
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Electrochemical and optical properties of CeO2-SnO2 and CeO2-SnO2:X (X = Li, C, Si) films

机译:CeO2-SnO2和CeO2-SnO2:X(X = Li,C,Si)薄膜的电化学和光学性质

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Thin solid films of CeO2-SnO2 (17 mol% Sn) and CeO2-SnO2:X (X = Li, C and Si) were prepared by the sol-gel route, using an aqueous-based process. The addition of Li, C and Si to the precursor solution leads to films with different electrochemical performances. The films were deposited by the dip-coating technique on ITO coated glass (Donnelly Glass) at a speed of 10 cm/min and submitted to a final thermal treatment at 450 °C during 10 min in air. The electrochemical and optical properties of the films were determined from the cyclic voltammetry and chronoamperometry measurements using 0.1 M LiOH as supporting electrolyte. The ion storage capacity of the films was investigated using in situ spectroelectrochemical method and during the insertion/extraction process the films remained transparent. The powders were characterized by thermal analysis (DSC/TGA) and X-ray diffraction.
机译:CeO2-SnO2(17 mol%Sn)和CeO2-SnO2:X(X = Li,C和Si)的固态薄膜是使用水基工艺通过溶胶-凝胶法制备的。将Li,C和Si添加到前体溶液中会导致膜具有不同的电化学性能。通过浸涂技术将膜以10 cm / min的速度沉积在ITO涂覆的玻璃(Donnelly Glass)上,并在空气中10分钟内于450°C进行最终热处理。膜的电化学和光学性质由循环伏安法和计时安培法测定,使用0.1 M LiOH作为支持电解质进行测定。使用原位光谱电化学方法研究了膜的离子存储容量,并且在插入/提取过程中,膜保持透明。通过热分析(DSC / TGA)和X射线衍射对粉末进行表征。

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