Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

Andrea Liscio; Chiara Musumeci; Paolo Samorigrave; Vincenzo Palermo

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Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

机译：通过导电原子力和开尔文探针力显微镜对纳米级超分子材料进行电子表征

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《Materials today》 |2014年第10期|共页
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Andrea Liscio; Chiara Musumeci; Paolo Samorigrave; Vincenzo Palermo;
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机译：用于纳米磁性和原子力显微镜的悬臂探针。

Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

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