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首页> 外文期刊>International Journal of Electrical and Computer Engineering >Defect Detection in Ceramic Images Using Sigma Edge Information and Contour Tracking Method
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Defect Detection in Ceramic Images Using Sigma Edge Information and Contour Tracking Method

机译:使用Sigma边缘信息和轮廓跟踪方法检测陶瓷图像中的缺陷

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摘要

In this paper, we suggest a method of detecting defects by applying Hough transform and least squares on ceramic images obtained from non-destructive testing. In the ceramic images obtained from non-destructive testing, the background area, where the defect does not exist, commonly shows gradual change of luminosity in vertical direction. In order to extract the background area which is going to be used in the detection of defects, Hough transform is performed to rotate the ceramic image in a way that the direction of overall luminosity change lies in the vertical direction as much as possible. Least squares is then applied on the rotated image to approximate the contrast value of the background area. The extracted background area is used for extracting defects from the ceramic images. In this paper we applied this method on ceramic images acquired from non-destructive testing. It was confirmed that extracted background area could be effectively applied for searching the section where the defect exists and detecting the defect.
机译:在本文中,我们提出了一种通过在无损检测获得的陶瓷图像上应用霍夫变换和最小二乘法来检测缺陷的方法。在通过非破坏性测试获得的陶瓷图像中,不存在缺陷的背景区域通常在垂直方向上显示出亮度的逐渐变化。为了提取将在缺陷检测中使用的背景区域,执行霍夫变换以使总光度变化方向尽可能位于垂直方向的方式来旋转陶瓷图像。然后将最小二乘应用于旋转后的图像,以近似背景区域的对比度值。提取的背景区域用于从陶瓷图像提取缺陷。在本文中,我们将这种方法应用于从无损检测获得的陶瓷图像。已经证实,提取的背景区域可以有效地用于搜索存在缺陷的部分并检测缺陷。

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