EDGE DEFECT DETECTION METHOD, EDGE DEFECT DETECTOR, EDGE DEFECT DETECTION PROGRAM, AND RECORDING MEDIUM

摘要

PPROBLEM TO BE SOLVED: To provide an edge defect detection method for automatically detecting edge defects appropriately. PSOLUTION: A display image is captured by a CCD camera in an imaging process ST100. A luminance value LSBi/SBfor each captured pixel is calculated, based on data captured in the imaging process ST100 (luminance value calculation process ST110). In a luminance emphasis process ST140, the absolute value of the difference between the luminance value LSBi/SBin a captured pixel to be noticed and a luminance value LSBi-1/SBin the captured pixel immediately above the luminance value LSBi/SBis calculated as a differential value DSBi/SB, and further the captured pixel adjacent to the captured pixel to be noticed is examined to search the maximum differential value DSBmax/SB, and the searched maximum differential value DSBmax/SBis added to the differential value DSBi/SBin the captured pixel to be noticed to calculate an emphasis differential value D'SBi/SB. The emphasis differential value D'SBi/SBof each captured pixel is compared with a prescribed luminance difference threshold D'SBs/SB, thus detecting the captured pixel in which the emphasis differential value D'SBi/SBis equal to or more than the luminance differential threshold D'SBs/SBas a defective section (defective section detection process ST150). PCOPYRIGHT: (C)2007,JPO&INPIT