EFFICIENT MEMORY BUILT - IN SELF TEST FOR EMBEDDED SRAM USING PA ALGORITHM

摘要

Memory-Built In Self-Test (MBIST) is an very effectual and output enrichment for embedded RAMs. This paper presents effectual MBIST concepts of Built-In-Self Test (BIST) using Performance Accelerator Algorithm (PAA). This BIST concept very stretchable for embedded RAMs with suitable operation. PA algorithm efficiently detects probable number of fault models compare to other March test algorithms. This algorithm has been synthesized and implemented in Xilinx Virtex-V (XC5VLX50). The implementation results are tabulated for March C and PA algorithm.