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首页> 外文期刊>International Journal of Clinical Medicine >The Comparison of Thick and Thin Intermediate Wafer in Maxillary Le Fort I Osteotomies
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The Comparison of Thick and Thin Intermediate Wafer in Maxillary Le Fort I Osteotomies

机译:上颌Le Fort I截骨术中厚晶圆和薄晶圆的比较

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>Background: Osteotomy wafers were routinely used in orthognathic surgery for repositioning the mobilized maxilla to achieve the planned final occlusion. >Objectives: The aim of the current study was to determine comparison of thick and thin intermediate wafer in maxillary Le Fort I osteotomies. Methods: This study was done in 9 patients who had maxillary prognathism or retrognathism abnormality. The maxillary cast was oriented using articulator after facebow transfer. Then photographic and cephalometric data was used to determine proper dental arch segments. All 9 patients had Le Fort I combined with mandibular sagittal split osteotomies. The Le Fort I surgery was done on lateral, septum and medial sinus of nasal and trigomaxillary. The cast was removed from the base articulator and think and thick wafers were fabricated for each. Then the wafers were fixed in 1, 2 and 3 mm anterior (A1, A2 and A3, respectively). After mobilization of the maxilla and adequate bone removal, the jaws were held in occlusion with the thin intermediate wafer. The maxilla was then located against the stable part of the facial skeleton above using the yet unoperated mandible as an autorotated guide. Then the superior reposition >1 or <1 m between two wafers was determined. >Results: According to the results, the superior reposition was higher in thin wafers fixed in A3 > A2 compared to A1. Also, the same result was detected in thick wafers fixed in A3 > A2 compared to A1, respectively. However, there was no significant difference in both thin and thick wafers in each fixed locations. >Conclusion: These results suggest thick wafers have acceptable results in maxillary Le Fort I osteotomies.
机译:>背景:在正颌外科中常规使用切骨术的晶片来重新定位动员的上颌骨,以实现计划的最终咬合。 >目的:本研究的目的是确定上颌Le Fort I截骨术中厚薄的中间晶片的比较。方法:本研究针对9例上颌前突或后突畸形患者进行。上弓转移后,使用咬合架定向上颌石膏。然后使用照相和头颅测量数据确定适当的牙弓弓段。所有9例患者均进行了Le Fort I联合下颌矢状劈开截骨术。 Le Fort I手术是在鼻和上颌骨的外侧,中隔和内侧窦处进行的。从基部咬合架上取下铸件,并为每一个制造厚晶片。然后将晶片固定在前,后1、2和3 mm(分别为A 1 ,A 2 和A 3 )中。动员上颌骨并充分去除骨骼后,将颌骨夹在薄薄的中间晶片上。然后使用尚未操作的下颌骨作为自动旋转的导向器,将上颌骨抵在上面面部骨骼的稳定部分上。然后确定两个晶片之间的> 1或<1 m的最佳位置。 >结果:结果表明,与A1相比,固定在A 3 2 中的薄晶圆的上乘位置更高。此外,与A 1 相比,在固定在A 3 2 的厚晶片中分别检测到相同的结果。但是,在每个固定位置上的薄晶圆和厚晶圆都没有显着差异。 >结论:这些结果表明,厚晶片在上颌Le Fort I截骨术中具有可接受的结果。

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