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Epitaxial growth of GaN films on nearly lattice-matched hafnium substrates using a low-temperature growth technique

机译:使用低温生长技术在几乎晶格匹配的substrate衬底上外延生长GaN膜

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We demonstrated epitaxial growth of GaN (0001) films on nearly lattice-matched Hf (0001) substrates by using a low-temperature (LT) epitaxial growth technique. High-temperature growth of GaN films results in the formation of polycrystalline films due to significant reaction at GaN/Hf heterointerfaces, while LT-growth allowed us to suppress the interfacial reactions and to obtain epitaxial GaN films on Hf substrates with a GaN112?0//Hf112?0 in-plane orientation. LT-grown GaN films can act as buffer layers for GaN growth at high temperatures. The interfacial layer thickness at the LT-GaN/Hf heterointerface was as small as 1 nm, and the sharpness of the contact remained unchanged even after annealing up to approximately 700?°C, which likely accounts for the dramatic improvement in GaN crystalline quality on Hf substrates.
机译:我们通过使用低温(LT)外延生长技术在几乎晶格匹配的Hf(0001)衬底上证明了GaN(0001)薄膜的外延生长。 GaN膜的高温生长由于GaN / Hf异质界面上的显着反应而导致形成多晶膜,而LT生长使我们能够抑制界面反应并在具有GaN112?0 /的Hf衬底上获得外延GaN膜。 / Hf112?0面内定向。 LT生长的GaN膜可用作高温下GaN生长的缓冲层。 LT-GaN / Hf异质界面处的界面层厚度小至1 nm,即使在退火至约700?C后,接触的锐度仍保持不变,这可能解释了GaN晶体质量的显着提高。 HF基材。

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