Ultrathin films of L10-MnAl on GaAs (001): A hard magnetic MnAl layer onto a soft Mn-Ga-As-Al interface

摘要

Ferromagnetic MnAl (L10-MnAl phase) ultrathin films with thickness varying from 1 to 5 nm have been epitaxially grown on a GaAs (001) substrate. A coercivity above 8 kOe has been obtained with no need of a buffer layer by tuning the sample preparation and the growth parameters. Surface and interface analysis carried out by in situ characterization techniques (x-ray photoelectron spectroscopy and low energy electron diffraction), available in the molecular beam epitaxy chamber, has shown the formation of a ferromagnetic interface consisting of Mn-Ga-As-Al, which contribution competes with the MnAl alloyed film. The appearance of this interface provides important information to understand the growth mechanism of MnAl-based films reported in the literature.