Thin films of lead sulphide (PbS) were deposited on a glass substrate at room temperature using spin coating technique. X-ray diffraction (XRD) is used to establish the structure and crystallite size of these films and scanning electron microscopy is used to study the particle size and morphology. The dielectric properties of PbS thin films were studied in the different frequency range of 50Hz-5MHz at different temperatures. The frequency dependence of the dielectric constant and dielectric loss is found to decrease with increase in frequency at different temperatures. In addition, the electronic properties like valence electron plasma energy, average energy gap or Penn gap, Fermi energy and electronic polarizability of the PbS thin films are also calculated.
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