Derivation of Reduced Test Vectors for Bit-Parallel Multipliers over GF(2^m)

摘要

This paper presents an algebraic testing method for detecting stuck-at faults in the polynomial basis (PB) bit parallel (BP) multiplier circuits over GF(2m). The proposed technique derives the test vectors from the expressions of the inner product (IP) variables without any requirement of ATPG tool. This low complexity testing method requires (2m+1) test vectors for detect-ing single stuck-at faults in the AND part and multiple stuck-at faults in EXOR part of the multiplier circuits. The test vectors are independent of multiplier''''s structure proposed in [11] but dependant on m. For the multiplier circuits, the test set is found to be smaller in size than the ATPG-generated test set. The test set provides 100% single stuck-at fault coverage.