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Energy-Aware Adaptive Restore Schemes for MLC STT-RAM Cache

机译:用于MLC STT-RAM缓存的能量感知自适应恢复方案

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摘要

For the sake of higher cell density while achieving near-zero standby power, recent research progress in Magnetic Tunneling Junction (MTJ) devices has leveraged Multi-Level Cell (MLC) configurations of Spin-Transfer Torque Random Access Memory (STT-RAM). However, in order to mitigate the write disturbance in an MLC strategy, data stored in the soft bit must be restored back immediately after the hard bit switching is completed. Furthermore, as the result of MTJ feature size scaling, the soft bit can be expected to become disturbed by the read sensing current, thus requiring an immediate restore operation to ensure the data reliability. In this paper, we design and analyze a novel Adaptive Restore Scheme for Write Disturbance (ARS-WD) and Read Disturbance (ARS-RD), respectively. ARS-WD alleviates restoration overhead by intentionally overwriting soft bit lines which are less likely to be read. ARS-RD, on the other hand, aggregates the potential writes and restore the soft bit line at the time of its eviction from higher level cache. Both of these two schemes are based on a lightweight forecasting approach for the future read behavior of the cache block. Our experimental results show substantial reduction in soft bit line restore operations, delivering 17.9 percent decrease in overall energy consumption and 9.4 percent increase in IPC, while incurring negligible capacity overhead. Moreover, ARS promotes advantages of MLC to provide a preferable L2 design alternative in terms of energy, area and latency product compared to SLC STT-RAM alternatives.
机译:为了实现更高的单元密度同时实现接近零的待机功率,磁隧道结(MTJ)器件的最新研究进展已经利用了自旋转移扭矩随机存取存储器(STT-RAM)的多层单元(MLC)配置。但是,为了减轻MLC策略中的写干扰,必须在完成硬位切换后立即恢复存储在软位中的数据。此外,作为MTJ特征尺寸缩放的结果,可以预期软位会被读取的检测电流干扰,因此需要立即进行恢复操作以确保数据的可靠性。在本文中,我们分别设计和分析了一种新颖的针对写入干扰(ARS-WD)和读取干扰(ARS-RD)的自适应还原方案。 ARS-WD通过有意覆盖不太可能被读取的软位线来减轻恢复开销。另一方面,ARS-RD聚合潜在的写入,并在从更高级别的缓存中逐出软位线时恢复软位线。这两种方案都基于轻量级的预测方法,用于缓存块的未来读取行为。我们的实验结果表明,软位线恢复操作显着减少,总能耗降低了17.9%,IPC降低了9.4%,而容量开销却可以忽略不计。此外,与SLC STT-RAM替代方案相比,ARS促进了MLC的优势,从而在能量,面积和等待时间乘积方面提供了更好的L2设计替代方案。

著录项

  • 来源
    《IEEE Transactions on Computers》 |2017年第5期|786-798|共13页
  • 作者单位

    Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL;

    Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL;

    Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL;

    Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL;

    Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL;

    Department of Electrical and Computer Engineering, Florida International University, Miami, FL;

    Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Magnetic tunneling; Switches; Random access memory; Resistance; Sensors; Magnetization; Reliability;

    机译:磁隧道;开关;随机存取存储器;电阻;传感器;磁化;可靠性;

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