ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems

摘要

Designing soft errors resilient systems is a complex engineering task, which nowadays follows a cross-layer approach. It requires a careful planning for different fault-tolerance mechanisms at different system's layers: starting from the technology up to the software domain. While these design decisions have a positive effect on the reliability of the system, they usually have a detrimental effect on its size, power consumption, performance and cost. Design space exploration for cross-layer reliability is therefore a multi-objective search problem in which reliability must be traded-off with other design dimensions. This paper proposes a cross-layer multi-objective design space exploration algorithm developed to help designers when building soft error resilient electronic systems. The algorithm exploits a system-level Bayesian reliability estimation model to analyze the effect of different cross-layer combinations of protection mechanisms on the reliability of the full system. A new heuristic based on the extremal optimization theory is used to efficiently explore the design space. Two exploration strategies are proposed. The first strategy aims at optimizing the reliability of the system alone. It is suited in those cases in which reaching a given reliability target is the sole goal. It focuses on finding a reduced set of system's components that, when protected, allow the designer to reach the desired reliability level. As a positive effect, by reducing the number of protected components, the overhead introduced by the fault tolerance techniques is reduced as well. The second strategy jointly considers the effect that the introduced fault-tolerance mechanisms have on the execution time, power, hardware area and software size. This strategy supports the exploration of the design space setting multiple objectives on different design dimensions. An extended set of simulations shows the capability of this framework when applied both to benchmark applications and realistic systems, providing optimized systems that outperform those obtained by applying state-of-the-art cross-layer reliability techniques.