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An Aging-Aware GPU Register File Design Based on Data Redundancy

机译:基于数据冗余的可感知老化的GPU寄存器文件设计

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Nowadays, GPUs sit at the forefront of high-performance computing thanks to their massive computational capabilities. Internally, thousands of functional units, architected to be fed by large register files, fuel such a performance. At deep nanometer technologies, the SRAM memory cells that implement GPU register files are very sensitive to the Negative Bias Temperature Instability (NBTI) effect. NBTI ages cell transistors by degrading their threshold voltage$V_{th}$over the lifetime of the GPU. This degradation, which manifests when a cell keeps the same logic value for a relatively long period of time, compromises the cell read stability and increases the transistor switching delay, which can lead to wrong read values and eventually exceed the processor cycle time, respectively, so resulting in faulty operation. This work proposes architectural mechanisms leveraging the redundancy of the data stored in GPU register files to attack NBTI aging. The proposed mechanisms are based on data compression, power gating, and register address rotation techniques. All these mechanisms working together balance the distribution of logic values stored in the cells along the execution time, reducing both the overall$V_{th}$degradation and the increase in the transistor switching delays. Experimental results show that a conventional GPU register file suffers the worst case for NBTI, since a significant fraction of the cells maintain the same logic value during the entire application execution (i.e., a 100 percent ‘0’ and ‘1’ duty cycle distributions). On average, the proposal reduces these distributions by 58 and 68 percent, respectively, which translates into$V_{th}$degradation savings by 54 and 62 percent, respectively.
机译:如今,GPU凭借其强大的计算能力而处于高性能计算的最前沿。在内部,成千上万个功能单元(旨在通过大型寄存器文件进行馈送)促进了这种性能。在深纳米技术中,实现GPU寄存器文件的SRAM存储单元对负偏压温度不稳定性(NBTI)效应非常敏感。 NBTI通过降低其阈值电压来老化单元晶体管 n $ V_ {th} $ 在GPU的整个生命周期内。这种退化表现在一个单元在相当长的一段时间内保持相同的逻辑值时,会损害该单元的读取稳定性并增加晶体管切换延迟,这可能导致错误的读取值并最终分别超过处理器周期时间。从而导致操作错误。这项工作提出了利用存储在GPU寄存器文件中的数据冗余来攻击NBTI老化的架构机制。所提出的机制基于数据压缩,功率门控和寄存器地址旋转技术。所有这些机制共同作用,可以在执行期间平衡存储在单元中的逻辑值的分布,从而减少总体 n $ V_ {th} $ < Alternatives> n降级和晶体管切换延迟的增加。实验结果表明,常规的GPU寄存器文件遭受NBTI的最坏情况,因为很大一部分单元在整个应用程序执行期间保持相同的逻辑值(即占空比为100%的“ 0”和“ 1”) 。该提案平均将这些分布分别减少了58%和68%,这转化为 n $ V_ {th} $ n降级节省分别为54%和62%。

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