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Experimental and computational analysis of the in situ tensile deformation of 2D honeycomb lattice structures in Ni single crystals

机译:Ni单​​晶中二维蜂窝晶格结构原位拉伸变形的实验和计算分析

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摘要

A similar to 12 mu m thick film of single crystal Ni was shaped with a focused ion beam (FIB) instrument to form a set of tensile samples with hexagonal holes of sides similar to 3 mu m long and similar to 2.5 mu m thick arranged in a honeycomb lattice structure. The plane normal of the film was <001> and the tensile axis was parallel to <100>. The samples were then tested in tension in situ inside a scanning electron microscope. The tensile properties, viz., yield strength and peak strength observed in the lattice sample, were higher than those of a standard sample by about 30%, while the strain to fracture decreased drastically. Finite element (FE) modelling, utilising size effect corrections and the modified Gurson model, was performed to elucidate the response of the microlattice, and it was found that the changes in the mechanical properties could be explained by the stress distribution around the hexagonal holes and localised sample size effects. These models were corroborated by observations of the crystal orientation using electron backscatter diffraction (EBSD) maps. The assumption of void formation as a mechanism of failure in the Gurson model was validated experimentally by transmission electron microscopy, which showed nano-voids in the thin bands formed by localised slip.
机译:用聚焦离子束(FIB)仪器对类似于12微米厚的单晶镍膜进行成形,以形成一组拉伸样品,该样品的六边形孔的边长约3μm,厚约2.5μm。蜂窝晶格结构。膜的平面法线为<001>,并且拉伸轴平行于<100>。然后在扫描电子显微镜内原位测试样品。在晶格样品中观察到的拉伸性能,即屈服强度和峰值强度,比标准样品高约30%,而断裂应变急剧下降。利用尺寸效应校正和改进的Gurson模型进行了有限元(FE)建模,以阐明微晶格的响应,发现力学性能的变化可以用六角孔周围的应力分布来解释。局部样本量效应。这些模型通过使用电子背散射衍射(EBSD)图观察晶体取向得到了证实。透射电子显微镜通过实验验证了在Gurson模型中将空洞形成作为破坏机理的假设,该实验通过局部滑移形成了薄带中的纳米空洞。

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