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Design and Demonstration of Power Delivery Networks With Effective Resonance Suppression in Double-Sided 3-D Glass Interposer Packages

机译:双面3-D玻璃中介层封装中具有有效谐振抑制能力的输电网络的设计和演示

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Ultrathin 3-D glass interposers with through-package vias at the same pitch as through-silicon vias (TSVs) have been proposed as a simpler and cheaper alternative to the direct 3-D stacking of logic and memory devices. Such 3-D interposers provide wide-I/O channels for high signal bandwidth (BW) between the logic device on one side of the interposer and memory stack on the other side, without the use of complex TSVs in the logic die. However, this configuration introduces power delivery design challenges due to resonance from: 1) the low-loss property of the glass substrate and 2) the parasitic inductance due to additional length from lateral power delivery path. This paper presents for the first time, the design and demonstration of power delivery networks (PDNs) in 30- thin, 3-D double-sided glass interposers, by suppressing the noise from mode resonances. The self-impedance of the 3-D glass interposer PDN was simulated using electromagnetic solvers, including printed-wiring-board and chip-level models. The 3-D PDN was compared with that of the 2-D glass packages having fully populated ball grid array connections. The resonance mechanism for each configuration was studied in detail, and the corresponding PDN loop inductances were evaluated. High impedance peaks in addition to the 2-D PDN were observed at high frequencies (near 7.3 GHz) in the 3-D interposer structure due to the increased inductances from lateral power delivery. This paper proposes and evaluates three important resonance suppression techniques based on: 1) 3-D interposer die configuration; 2) the selection and placement of decoupling capacitors; and 3) 3-D interposer package power and ground stack-up. Two-metal and four-metal layer test vehicles were fabricated on 30- and 100- thick panel-based glass substrates, respectively, - o validate the modeling and analysis of the proposed approach. The PDN test structures were characterized up to 20 GHz for plane resonances and network impedances, with good model-to-hardware correlation. The results in this paper suggest that the ultrathin 3-D interposer PDN structure can be effectively designed to meet the target impedance guidelines for high-BW applications, providing a compelling alternative to 3-D-IC stacking with the TSVs.
机译:已经提出了具有与硅通孔(TSV)相同间距的通孔的超薄3D玻璃中介层,作为逻辑和存储器件直接3D堆叠的更简单,更便宜的替代方案。这样的3-D插入器在插入器一侧的逻辑设备与另一侧的存储器堆栈之间提供了宽的I / O通道,以实现高信号带宽(BW),而无需在逻辑芯片中使用复杂的TSV。然而,由于以下原因引起的谐振,这种配置引入了功率传输设计挑战:1)玻璃基板的低损耗特性; 2)由于距横向功率传输路径额外的长度而引起的寄生电感。本文通过抑制模式共振产生的噪声,首次展示了30薄,3D双面玻璃中介层中的功率传输网络(PDN)的设计和演示。使用电磁求解器(包括印刷线路板和芯片级模型)模拟了3-D玻璃中介层PDN的自阻抗。将3-D PDN与具有完全填充的球栅阵列连接的2-D玻璃封装进行了比较。详细研究了每种配置的谐振机制,并评估了相应的PDN环路电感。在3-D中介层结构中,由于横向功率传输增加了电感,因此在2-D PDN之外的高频处(在7.3 GHz附近)也观察到了高阻抗峰。本文基于以下方面提出并评估了三种重要的谐振抑制技术:1)3-D中介层芯片的配置; 2)去耦电容器的选择和放置;和3)3-D中介层封装电源和接地堆叠。在30和100厚的基于面板的玻璃基板上分别制造了两种金属和四种金属的测试工具,以验证所提出方法的建模和分析。 PDN测试结构在高达20 GHz的频率下具有平面共振和网络阻抗特性,并且具有良好的模型与硬件相关性。本文的结果表明,可以有效设计超薄3-D中介层PDN结构,以满足高BW应用的目标阻抗准则,从而为与TSV进行3-D-IC堆叠提供了引人注目的替代方案。

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