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Optimal Binning Strategies Under Squared Error Loss in Selective Assembly with a Tolerance Constraint

机译:具有公差约束的选择性装配误差在平方误差下的最优装箱策略

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摘要

Selective assembly is an effective approach for improving the quality of a product assembled from two types of components when the qualify characteristic is the clearance between the mating components. In this article, optimal binning strategies under squared error loss in selective assembly when the clearance is constrained by a tolerance parameter are discussed. Conditions for a set of constrained optimal partition limits are given, and uniqueness of this set is shown for the case when the dimensional distributions of the two components are identical and strongly unimodal. Some numerical results are reported that compare constrained optimal partitioning, unconstrained optimal partitioning, and equal width partitioning.
机译:当合格特性是配合组件之间的间隙时,选择性组装是一种提高由两种类型组件组装的产品质量的有效方法。在本文中,讨论了在间隙受公差参数约束的情况下,选择性装配中误差平方误差下的最佳装仓策略。给出了一组约束的最佳分配界限的条件,并且当两个组件的尺寸分布相同且具有强烈的单峰性时,显示了该组的唯一性。报告了一些数值结果,它们比较了受约束的最佳分区,无约束的最佳分区和等宽分区。

著录项

  • 来源
    《Communications in Statistics》 |2010年第5期|592-605|共14页
  • 作者

    SHUN MATSUURA; NOBUO SHINOZAKI;

  • 作者单位

    Research Fellow of Japan Society for the Promotion of Science, School of Science for Open and Environmental Systems, Graduate School of Science and Technology, Keio University, Yokohama, Japan;

    Department of Administration Engineering. Faculty of Science and Technology, Keio University, 3-14-1, Hiyoshi, Kohoku, Yokohama 223-8522, Japan;

  • 收录信息 美国《科学引文索引》(SCI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    match gauging; quality control; specification limits; strongly unimodal;

    机译:比赛测量质量控制;规格限制;强单峰;

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